Soft X-ray spectroscopy and microscopy

Homepage: Soft X-Ray Spectroscopy and Microscopy

The working group focuses on the development and applications of high photon flux XUV and soft x-ray sources. Such sources are enabled by high harmonic generation with high average power femtosecond fiber lasers. These unique table-top short-wavelength sources are employed for spectroscopy of highly-charged ions and nanoscale imaging.

Contact

Dr. Jan Rothhardt
Institut für Angewandte Physik
Friedrich-Schiller-Universität Jena
Albert-Einstein-Straße 15

07745 Jena
Tel: +49 3641 947-818
Fax: +49 3641 947-802
j.rothhardt(at)hi-jena.gsi.de